ADVANCED MATHEMATICAL AND COMPUTATIONAL TOOLS IN METROLOGY AND TESTING IX

This volume belongs to the Series on Advances in Mathematics for Applied Sciences. The volume contains original refereed worldwide contributions. They were prompted by presentations made at the ninth Conference held in Göteborg in June 2011 on the theme of Advanced Mathematical and Computational Tools in Metrology and Testing

The themes in this volume  reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also keeping the challenge promoted by the metro Convention, to access a mutual recognition for the measurement standards.

The main objectives of these contributions are present and promote reliable and effective mathematical and computational tools in metrology and testing, to understand better the modeling, statistical and computational requirements in metrology and testing. To provide a forum for metrologists, mathematicians, software and IT engineers that will encourage a more effective synthesis of skills, capabilities and resources.

In the more than 50 articles in this book different techniques and mathematical and statistical methods are applied to problems of great interest such as: Characterization of Face Measurement, Bayesian Inference in Waveform Metrology, etc.

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